Revision: Published Date: January ; Status: Superseded By: Superseded By : ASME B; Document Language: Published By: ASME International (ASME). ASME B Surface Texture (Surface Roughness, Waviness, and Lay) By: ASME International (ASME); Page Count: ; ANSI Approved: Yes; DoD. ASME B Ssk. Surface Skewness. ISO /1. ASME B ISO/DIS 2. ASME B Sku. Surface Kurtosis. ANSI B ASME B ISO/DIS.

Author: Vuramar Kazrajinn
Country: Czech Republic
Language: English (Spanish)
Genre: Education
Published (Last): 16 June 2011
Pages: 45
PDF File Size: 14.45 Mb
ePub File Size: 8.44 Mb
ISBN: 213-9-32380-887-7
Downloads: 33242
Price: Free* [*Free Regsitration Required]
Uploader: Dizil

The waviness consists of more ansu spaced irregularities, which might be produced by vibration or chatter in the machine. In particular, we will show functional examples in optics, hydrodynamic drag, and aerodynamic drag, in turn.

Areal Measurement of Topography, Surface Topography 1 Characterization of Surface Roughness, Prec. For an anisotropic surface the correlation length is in the direction perpendicular to the surface lay.

Altogether we tested 41 surfaces including sinusoidal and ruled surfaces, specimens that were replicas of ground, shaped, side-milled, and end-milled surfaces, as well as surfaces formed by electrical discharge machining. The spacing between fringes is equivalent to a height difference of one-half of the optical wavelength, i. It is likely true that they were drawn up empirically and were probably similar to specifications elsewhere in the automobile industry.

In fact something like parameters have been defined for industrial use and many of these appear in national standards as well [15]. In ordinary use you only do two-dimensional profiling of the surface; 3-D mapping would require special operation.

A typical wavelength parameter, recognized as standard by the International Organization for Standardization ISO [2], is the mean peak spacing Sjjj Fig. It has a flexible backing and is housed in a case with two shoulders that serve as stops when the element is pressed on the surface.

In particular the knowledge development system will be useful for functional correlation studies in product life testing.

Surface Roughness – Terminology – Part 1: Styii are available with tip widths rated as small as 0. However, the peak for the first harmonic at “”0. The motion of the carriage is constrained by sliding on the smooth reference, and the vertical motion of the stylus is measured with respect to the carriage. The pilot specimens may be used as check standards, since they should yield the same measured value of roughness from day-to-day.


Surface Texture of Investment Castings

The interference pattern is formed in the objective, shown in the detail on the right. It should be noted that the distance scale on the right hand graph is slightly different from the one on the left. Figure lists ase components of surface topography. It has a sensitivity of approximately one angstrom or one- two -hundredth of a microinch.

Cast Microfinish Comparator

The degree of focus azme on the vertical position of the absi with respect to the scanning optics. SRMshown at the top, is available to the public now, and the other two should be available fairly soon. In addition, the sensitive frequency ranges are different. The resulting surface profiles are exemplified in Fig.

We have tested it for hand- lapped surfaces. The only movement is the vertical movement of the piezo transducer over a total amplitude of approximately one-half wavelength of light. Specified roughness heights for these kinds of applications are on the order of fractions of a micrometer.

A related question is the idea of the reference line. In addition, they are two-dimensional instruments, so the surface profile is a vanishingly small fraction of the surface area. Phase Corrected Digital Filters In order to overcome the undesirable phase characteristics of the standard two-stage RC filter, a new class of filters has been developed [5], using digital techniques implemented on microcomputers.

There are other aspects about the scattered light pattern that are indicators of the roughness as well. Shape parameters help to quantify the differences between these surfaces. In addition to these average height parameters, extreme height parameters have asmme defined for one application or another.


The ansl several figures illustrate the phenomena by showing light scattering patterns from a set of periodic, sinusoidal surfaces [19]. Two parameters of the instrumentation are important in the specification of roughness measurements.

However, every few years a profilometer inspection of an as-cast surface texture will find and reject some area of a part for being in excess of a RMS Max drawing requirement. The first parameter is calculated directly from the image, while the remaining are based on the Fourier spectrum. Optical sectioning [2] is a useful method for quickly obtaining a surface profile.

Precision Optical Testing, Science The ultrasonic radiation propagates well along a stream of coolant fluid, such as might be used during a machining process.

Now, the specimen and reference fiat are both located in the focal plane of the objective of a microscope not shown. This is a circular profile, the two ends of which are at the same place on the surface.

The tip follows contour B, in one ggse to keep the lunnelinf current constant STM nod in other lo mainuin consuni force between tip and sample AFM. If the angle of the ridges is turned clockwise, the angle is positive and if the angle of the ridges is turned anti-clockwise, the angle becomes negative.

Dimensions of Restriction Orifice Plates for ASME B Raised Face Flanges

This standard nasi also available in these packages:. A stylus with a large radius fails to pick up some of the finer surface structure that may be detected by a fine stylus. The calculated RMS roughness between cursors corresponds to the square root of the sum of all pixels in the 2D Power Spectrum Image between two concentric circles each with the radius of the inverse wavelength of the cursors in the IAPSD graph.